Digital manufacturing systems are increasingly vulnerable to hardware and software Trojans that can compromise the integrity, confidentiality, and availability of manufactured products. This comprehensive survey examines the landscape of Trojans in digital manufacturing, analyzing attack vectors, detection methods, and defense mechanisms across the manufacturing lifecycle.
@article{basuroy2023trojans,title={A survey of Digital Manufacturing Hardware and Software Trojans},author={Basu Roy, Prithwish and Bhargava, Mudit and Chang, Chia-Yun and Hui, Ellen and Gupta, Nikhil and Karri, Ramesh and Pearce, Hammond},journal={arXiv preprint},year={2023},url={https://arxiv.org/abs/2301.10336},google_scholar_id={d1gkVwhDpl0C},dimensions={true},}
This paper presents a comprehensive approach to developing performance metrics for benchmarking Simultaneous Localization and Mapping (SLAM) algorithms. We propose standardized evaluation criteria that enable fair comparison across different SLAM implementations, addressing key aspects such as accuracy, robustness, and computational efficiency.
@article{bhargava2021slam,title={Towards development of performance metrics for benchmarking SLAM algorithms},author={Bhargava, Mudit and Mehta, Rushad and Adhikari, Chandan Das and Sivanathan, K.},journal={Journal of Physics: Conference Series},volume={1964},number={6},pages={062115},year={2021},publisher={IOP Publishing},doi={10.1088/1742-6596/1964/6/062115},url={https://iopscience.iop.org/article/10.1088/1742-6596/1964/6/062115},google_scholar_id={u5HHmVD_uO8C},dimensions={true},}
This paper presents a novel multistep configuration approach for enhancing the performance of MEMS-based piezoelectric pressure sensors. The proposed design demonstrates improved sensitivity and linearity compared to conventional single-step configurations, making it suitable for precision measurement applications.
@inproceedings{bhargava2019mems,title={Performance Enhancement of MEMS based Piezoelectric Pressure Sensor using Multistep Configuration},author={Bhargava, Mudit and Tamboli, Alkausil and Sivanathan, K.},booktitle={2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO)},pages={576--579},year={2019},organization={IEEE},doi={10.1109/NANO46743.2019.8993875},url={https://ieeexplore.ieee.org/abstract/document/8993875},google_scholar_id={9yKSN-GCB0IC},dimensions={true},}